Developments of new concept analytical instruments for failure analyses of sub-100 nm devices. - Yasuhiro Mitsui; Fumiko Yano; Hiroshi Kakibayashi; Hiroyasu Shichi; Takashi Aoyama (Microelectron. Reliab., 2001)

New alteration detecting technique for printed documents using dot pattern watermarking. - Masahiko Suzaki; Yasuhiro Mitsui; Masayuki Suto (Security and Watermarking of Multimedia Contents, 2003)

A study of electrical characteristic changes in MOSFET by electron beam irradiation. - Yasuhiro Mitsui; Takeshi Sunaoshi; Jon C. Lee (Microelectron. Reliab., 2009)