On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. - Seiji Kajihara; Yasumi Doi; Lei Li 036; Krishnendu Chakrabarty (ICCD, 2003)

Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. - Yasumi Doi; Seiji Kajihara; Xiaoqing Wen; Lei Li 036; Krishnendu Chakrabarty (ASP-DAC, 2005)