A 3D analysis technique for detecting trace metal contamination. - Yasunori Goto; Tomokatsu Higuchi (Microelectron. Reliab., 2006)

Defect analysis concerning variation in characteristics of PIN diode for Hybrid Vehicles. - Yasunori Goto (Microelectron. Reliab., 2008)

Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique. - Yasunori Goto; Toru Matsumoto 002; Kiyoshi Nikawa (Microelectron. Reliab., 2013)