Electron Beam Tester Integrated into a VLSI Tester. - Hironobu Niijima; Yasuo Tokunaga; Shouichi Koshizuka; Kazuo Yakuwa; Péter Fazekas; Mathias Sturm; Hans-Peter Feuerbaum (ITC, 1988)

High Performance Electron Beam Tester for Voltage Measurement on Unpassivated and Passivated Devices. - Yasuo Tokunaga; Jürgen Frosien (ITC, 1989)