Single Event Effects as a Reliability Issue of IT Infrastructure. - Eishi Ibe; Hideaki Kameyama; Yasuo Yahagi; Hironaru Yamaguchi (ICITA (1), 2005)

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. - Eishi Ibe; S. S. Chung; ShiJie Wen; Hironaru Yamaguchi; Yasuo Yahagi; Hideaki Kameyama; Shigehisa Yamamoto; Takashi Akioka (CICC, 2006)