Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning. - Naoki Kuramoto; Kenichi Fujii; Yasushi Azuma; Shigeki Mizushima; Yasutake Toyoshima (IEEE Trans. Instrum. Meas., 2007)

Improvements to the Volume Measurement of 28Si Spheres to Determine the Avogadro Constant. - Naoki Kuramoto; Yasushi Azuma; Hajime Inaba; Feng-Lei Hong; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2015)

Surface Layer Analysis of Si Sphere by XRF and XPS. - Lulu Zhang 002; Yasushi Azuma; Akira Kurokawa; Naoki Kuramoto; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2015)

Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry. - Kazuaki Fujita; Naoki Kuramoto; Yasushi Azuma; Shigeki Mizushima; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Realization of the Kilogram Based on the Planck Constant at NMIJ. - Naoki Kuramoto; Lulu Zhang 002; Shigeki Mizushima; Kazuaki Fujita; Yasushi Azuma; Akira Kurokawa; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS. - Lulu Zhang 002; Naoki Kuramoto; Yasushi Azuma; Akira Kurokawa; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ. - Naoki Kuramoto; Shigeki Mizushima; Lulu Zhang 002; Kazuaki Fujita; Sho Okubo; Hajime Inaba; Yasushi Azuma; Akira Kurokawa; Yuichi Ota; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2021)

Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry. - Kazuaki Fujita; Kenichi Fujii; Lulu Zhang 002; Yasushi Azuma; Shigeki Mizushima; Naoki Kuramoto (IEEE Trans. Instrum. Meas., 2022)