Failure mode analysis of GaN-HEMT under high temperature operation. - Yasuyo Kurachi; Hiroshi Yamamoto; Yukinori Nose; Satoshi Shimizu; Yasunori Tateno; Takumi Yonemura; Masato Furukawa (IRPS, 2018)

Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests. - Yasunori Tateno; Yasuyo Kurachi; Hiroshi Yamamoto; Takashi Nakabayashi (IRPS, 2018)