Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. - Noriyoshi Itazaki; Fumiro Matsuki; Yasuyuki Matsumoto; Kozo Kinoshita (Asian Test Symposium, 1998)

University of Siegen, Kobe University and NICT at TRECVID 2015 SIN and MED Tasks. - Kimiaki Shirahama; Takashi Shinozaki; Yasuyuki Matsumoto; Marcin Grzegorzek; Kuniaki Uehara (TRECVID, 2015)

Kobe University, NICT and University of Siegen at TRECVID 2016 AVS Task. - Yasuyuki Matsumoto; Takashi Shinozaki; Kimiaki Shirahama; Marcin Grzegorzek; Kuniaki Uehara (TRECVID, 2016)