Fault Detection for Plasma Etching Processes Using RBF Neural Networks. - Yaw-Jen Chang (ISNN (3), 2005)

Virtual Metrology Technique for Semiconductor Manufacturing. - Yaw-Jen Chang; Yuan Kang; Chin-Liang Hsu; Chi-Tim Chang; Tat Yan Chan (IJCNN, 2006)

Feature Extraction of Waveform Signals for Uncertain Dynamic Processes Using Neural Networks. - Yaw-Jen Chang; Chi-Tim Chang; Jui-Ju Tsai (IJCNN, 2007)

Process optimization based on neural network model and orthogonal arrays. - Yaw-Jen Chang; Jui-Ju Tsai (IEEE Congress on Evolutionary Computation, 2008)

Fault detection for plasma-enhanced chemical vapor deposition process using feature extraction. - Yaw-Jen Chang (CASE, 2012)

Microfluidic Platform for Enzyme-Linked and Magnetic Particle-Based Immunoassay. - Nikhil Bhalla; Danny Wen-Yaw Chung; Yaw-Jen Chang; Kimberly Jane S. Uy; Yi Ying Ye; Ting-Yu Chin; Hao Chun Yang; Dorota G. Pijanowska (Micromachines, 2013)