Defect and microstructural evolution in thermally cycled Cu through-silicon vias. - James Marro; Chukwudi Okoro; Yaw S. Obeng; Kathleen A. Richardson (Microelectron. Reliab., 2014)

Hardware security through chain assurance. - Yaw S. Obeng; Colm Nolan; David Brown (DATE, 2016)

Deterministic Tagging Technology for Device Authentication. - Jungjoon Ahn; Jihong Kim 001; Joseph J. Kopanski; Yaw S. Obeng (ICICDT, 2021)