Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer. - Weichun Luo; Hong Yang; Wenwu Wang 006; Yefeng Xu; Bo Tang; Shangqing Ren; Hao Xu; Yanrong Wang; Luwei Qi; Jiang Yan; Huilong Zhu; Chao Zhao; et al. (Microelectron. Reliab., 2016)

A Noisy-Robust Approach for Facial Expression Recognition. - Ying Tong; Yuehong Shen; Bin Gao 004; Fenggang Sun; Rui Chen 009; Yefeng Xu (KSII Trans. Internet Inf. Syst., 2017)

Adaptive Fuzzy Tracking Control for Stochastic Nonlinear Systems with Full-State Constraints. - Yefeng Xu; Yihao Zhang; Sijia Chen; Kanjian Zhang; Liping Xie (Int. J. Fuzzy Syst., 2024)