Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration. - Wen-Yi Chen; Ming-Dou Ker; Yeh-Jen Huang; Yeh-Ning Jou; Geeng-Lih Lin (APCCAS, 2008)

Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection. - Wen-Yi Chen; Ming-Dou Ker; Yeh-Ning Jou; Yeh-Jen Huang; Geeng-Lih Lin (ISCAS, 2009)

Impact of guard ring layout on the stacked low-voltage PMOS for high-voltage ESD protection. - Seian-Feng Liao; Kai-Neng Tang; Ming-Dou Ker; Jia-Rong Yeh; Hwa-Chyi Chiou; Yeh-Jen Huang; Chun-Chien Tsai; Yeh-Ning Jou; Geeng-Lih Lin (ECCTD, 2015)

Analyzing Gate-Driven Circuit Parameters for Adding ESD Performances. - Shao-Chang Huang; Chih-Cherng Liao; Hsien-Feng Liao; Shou-Peng Weng; Karuna Nidhi; Yu-Kai Wang; Yi-Jen Chen; Hwa-Chyi Chiou; Yeh-Ning Jou; Jian-Hsing Lee (ICCE-TW, 2019)

Gate Voltages Impacting on Latch-up Measurements. - Shao-Chang Huang; Jian-Hsing Lee; Chun-Chih Chen; Ching-Ho Li; Chih-Cherng Liao; Kai-Chieh Hsu; Gong-Kai Lin; Li-Fan Chen; Chien-Wei Wang; Chih-Hsuan Lin; Yeh-Ning Jou; Ke-Horng Chen (ICCE-TW, 2022)

Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection. - Jian-Hsing Lee; Yeh-Jen Huang; Li-Yang Hong; Li-Fan Chen; Yeh-Ning Jou; Shin-Cheng Lin; Walter Wohlmuth; Chih-Cherng Liao; Ching-Ho Li; Shoa-Chang Huang; Ke-Horng Chen (IRPS, 2022)

Bipolar Transistors' Holding Phenomena. - Shao-Chang Huang; Kai-Chieh Hsu; Chih-Hsuan Lin; Chien-Wei Wang; Ching-Ho Li; Chih-Cherng Liao; Jung-Tsun Chuang; Gong-Kai Lin; Lin-Fan Chen; Chun-Chih Chen; Yeh-Ning Jou; Jian-Hsing Lee; et al. (ICCE-Taiwan, 2023)

Transmission Line Pulse Width Impacting on Device Performances. - Shao-Chang Huang; Chien-Wei Wang; Chih-Hsuan Lin; Kai-Chieh Hsu; Ching-Ho Li; Chih-Cherng Liao; Jung-Tsun Chuang; Gong-Kai Lin; Lin-Fan Chen; Chun-Chih Chen; Yeh-Ning Jou; Jian-Hsing Lee; et al. (ICCE-Taiwan, 2023)

Negative Triggering Current Induced the Latch-up in the Circuit without the ESD device to Power. - Yeh-Jen Huang; Li-Yang Hong; Yeh-Ning Jou; Jian-Hsing Lee (ICCE-Taiwan, 2024)