Prognosis of chip-loss failure in high-power IGBT module by self-testing. - Yeke Liu; Dawei Xiang; Yifan Fu (IECON, 2016)

High-Power Wire Bonded GaN Rectifier for Wireless Power Transmission. - Sumin D. Joseph; Shawn S. H. Hsu; Ahmed Alieldin; Chaoyun Song; Yeke Liu; Yi Huang 001 (IEEE Access, 2020)

Miniaturized Low-Pass Filter Using IPD Technology for Cryogenic Quantum Applications. - Hung-Chun Lin; Yin-Cheng Chang; Ho-Chun Wu 002; Ted C. Y. Chang; Chih-Cheng Lin; Yeke Liu; Da-Chiang Chang; Shawn S. H. Hsu (QCE, 2024)

Critical Role of Holes in Reliability, Robustness and Stability of GaN-on-Si HEMTs for Power and RF Applications. - Roy K.-Y. Wong; Yeke Liu; Po-Yen Huang; Haoran Wang; Chun-Hao Lai; Chun Chuang; Xue-Han Chen; Shawn S. H. Hsu; Chih-Kai Chang; Ming-Cheng Lin (IRPS, 2025)