High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. - SangHoon Shin; Yen-Pu Chen; Woojin Ahn; Honglin Guo; Byron Williams; Jeff West; Tom Bonifield; Dhanoop Varghese; Srikanth Krishnan; Muhammad Ashraful Alam (IRPS, 2018)

An Analytical Transient Joule Heating Model for an Interconnect in a Modern IC: Material Selection (Cu, Co, Ru) and Cooling Strategies. - Woojin Ahn; Yen-Pu Chen; Muhammad Ashraful Alam (IRPS, 2019)

A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. - Yen-Pu Chen; Bikram Kishore Mahajan; Dhanoop Varghese; Srikanth Krishnan; Vijay Reddy; Muhammad Ashraful Alam (IRPS, 2020)

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. - Bikram Kishore Mahajan; Yen-Pu Chen; Dhanoop Varghese; Vijay Reddy; Srikanth Krishnan; Muhammad Ashraful Alam (IRPS, 2021)

A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. - Bikram Kishore Mahajan; Yen-Pu Chen; Muhammad Ashraful Alam; Dhanoop Varghese; Srikanth Krishnan; Vijay Reddy (IRPS, 2022)

Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors. - Bikram Kishore Mahajan; Yen-Pu Chen; Ulisses Alberto Heredia Rivera; Rahim Rahimi; Muhammad Ashraful Alam (IRPS, 2022)