Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability. - Yeohyeok Yun; Gang-Jun Kim; Ji-Hoon Seo; Donghee Son; Bongkoo Kang (Microelectron. Reliab., 2018)

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. - Yeohyeok Yun; Ji-Hoon Seo; Donghee Son; Bongkoo Kang (Microelectron. Reliab., 2018)