Reliability of STT-MRAM for various embedded applications. - Shinhee Han; Junghyuk Lee; Kiseok Suh; Kyungtae Nam; Daeeun Jeong; Sechung Oh; Sohee Hwang; Yongsung Ji; Kilho Lee; Kangho Lee; Yoonjong Song; Yeongki Hong; et al. (IRPS, 2021)