A 28-nm 323 TOPS/mm2/b and 2007 TOPS/W/b Ternary Latch Based Sparsity-Aware CIM Macro With Double-Sampling Ternary ADC. - Myoung Kim; Hoichang Jeong; Woo-Seok Kim; Yesong Jeong; Young-Eun Choi; Junyoung Park 002; Min Woo Ryu; Yong Kyu Lee 002; Kyuho Jason Lee; Kyung Rok Kim (A-SSCC, 2024)