Geometric variability impact on 7nm Trigate combinational cells. - Alexandra L. Zimpeck; Ygor Aguiar; Cristina Meinhardt; Ricardo Reis 001 (ICECS, 2016)

Permanent and single event transient faults reliability evaluation EDA tool. - Y. Q. de Aguiar; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2016)

SET response of FinFET-based majority voter circuits under work-function fluctuation. - Y. Q. de Aguiar; Fernanda Lima Kastensmidt; Cristina Meinhardt; Ricardo A. L. Reis (ICECS, 2017)

Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. - Ygor Q. Aguiar; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (ICECS, 2017)

Robustness of Sub-22nm multigate devices against physical variability. - Alexandra L. Zimpeck; Ygor Aguiar; Cristina Meinhardt; Ricardo Reis 001 (ISCAS, 2017)

Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. - Ygor Q. de Aguiar; Cristina Meinhardt; Ricardo A. L. Reis (LASCAS, 2017)

Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. - Y. Q. de Aguiar; Laurent Artola; Guillaume Hubert; Cristina Meinhardt; Fernanda Lima Kastensmidt; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2017)

Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. - Walter E. Calienes Bartra; Y. Q. de Aguiar; Cristina Meinhardt; Andrei Vladimirescu; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2017)

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. - Ygor Q. Aguiar; Frederic Wrobel; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Antoine D. Touboul; Vincent Pouget (Microelectron. Reliab., 2018)

Effect of Temperature on Single Event Latchup Sensitivity. - S. Guagliardo; Frederic Wrobel; Ygor Q. Aguiar; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Vincent Pouget; Antoine D. Touboul (DTIS, 2020)