Analysis of Si and GaN GAA-NW-FETs in High-k Gate Oxides for Next Generation Mobile Systems. - Ygor Fonseca; Rafael Nóbrega; Ulysses Duarte; Thiago R. Raddo; Iyad Dayoub; Anderson L. Sanches; Murilo Bellezoni Loiola (CSNDSP, 2020)