Test Compression with Single-Input Data Spreader and Multiple Test Sessions. - Chang-Wen Chen; Yi-Cheng Kong; Kuen-Jong Lee (ATS, 2017)

Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run. - Yi-Cheng Kung; Kuen-Jong Lee; Sudhakar M. Reddy (ITC-Asia, 2018)

Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run. - Yi-Cheng Kung; Kuen-Jong Lee; Sudhakar M. Reddy (ITC, 2018)

Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run. - Yi-Cheng Kung; Kuen-Jong Lee; Sudhakar M. Reddy (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)