Analysis and Detection of Timing Failures in an Experimental Test Chip. - Piero Franco; Siyad C. Ma; Jonathan Chang; Yi-Chin Chu; Sanjay Wattal; Edward J. McCluskey; Robert L. Stokes; William D. Farwell (ITC, 1996)

Experimental Results for IDDQ and VLV Testing. - Jonathan T.-Y. Chang; Chao-Wen Tseng; Yi-Chin Chu; Sanjay Wattal; Mike Purtell; Edward J. McCluskey (VTS, 1998)