Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. - Jyi-Tsong Lin; Yi-Chuen Eng; Tai-Yi Lee; Kao-Cheng Lin (VLSI Design, 2007)

Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. - Jyi-Tsong Lin; Yi-Chuen Eng (J. Comput., 2008)