Investigation on the abnormal resistive switching induced by ultraviolet light exposure based on HfOx film. - Kow-Ming Chang; Wen-Hsien Tzeng; Kou-Chen Liu; Yi-Chun Chan; Chun-Chih Kuo (Microelectron. Reliab., 2010)

The resistive switching characteristics of a Ti/Gd2O3/Pt RRAM device. - Kou-Chen Liu; Wen-Hsien Tzeng; Kow-Ming Chang; Yi-Chun Chan; Chun-Chih Kuo; Chun-Wen Cheng (Microelectron. Reliab., 2010)