Diagnosis for Reconfigurable Single-Electron Transistor Arrays with a More Generalized Defect Model. - Chia-Cheng Wu; Yi-Hsiang Hu; Chia-Chun Lin; Yung-Chih Chen; Juinn-Dar Huang; Chun-Yao Wang (ACM J. Emerg. Technol. Comput. Syst., 2021)