Coupling damage and reliability modeling for creep and fatigue of solder joint. - Yunxia Chen; Yi Jin 004; Rui Kang (Microelectron. Reliab., 2017)

Cascading Failure Modeling for Circuit Systems Using Impedance Networks: A Current-Flow Redistribution Approach. - Yi Jin 004; Yunxia Chen; Zhendan Lu; Qingyuan Zhang; Rui Kang (IEEE Trans. Ind. Electron., 2021)

Belief Reliability Evaluation Method Based on Similar Product Information. - Tianpei Zu; Ze Wang; Yi Jin 004; Rui Kang (ICSRS, 2023)

Cascading failures modeling of electronic circuits with degradation using impedance network. - Yi Jin 004; Qingyuan Zhang; Yunxia Chen; Zhendan Lu; Tianpei Zu (Reliab. Eng. Syst. Saf., 2023)

Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network. - Yi Jin 004; Qingyuan Zhang (Symmetry, 2024)