Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. - Manish Sharma; Brady Benware; Lei Ling; David Abercrombie; Lincoln Lee; Martin Keim; Huaxing Tang; Wu-Tung Cheng; Ting-Pu Tai; Yi-Jung Chang; Reinhart Lin; Albert Mann (ITC, 2008)