PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. - Yi-Tsung Lin; Meng-Fan Wu; Jiun-Lang Huang (ATS, 2008)

Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing. - Yi-Tsung Lin; Jiun-Lang Huang; Xiaoqing Wen (ITC, 2011)

A Transition Isolation Scan Cell Design for Low Shift and Capture Power. - Yi-Tsung Lin; Jiun-Lang Huang; Xiaoqing Wen (Asian Test Symposium, 2012)

An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. - Po-Fan Hou; Yi-Tsung Lin; Jiun-Lang Huang; Ann Shih; Zoe F. Conroy (ATS, 2016)

The study of wear behaviors on abducted hip joint prostheses by an alternate finite element approach. - Yi-Tsung Lin; James Shih-Shyn Wu; Jian-Horng Chen (Comput. Methods Programs Biomed., 2016)