An Improved NRW Method for Thin Material Characterization Using Dielectric Filled Waveguide and Numerical Compensation. - Haidong Chen; Jun Zhang 079; Yi Wang 090; Wenquan Che; Zhengsheng Huang; Yuanjian Qiao; Junrong Luo; Quan Xue (IEEE Trans. Instrum. Meas., 2022)

Advanced Multiprobe Dual-Polarized Arch System for Microwave Reflectance Measurement. - Haidong Chen; Zhaoling He; Jieyao Yang; Weijun Zhong; Haitian Zhou; Mengzhu Yan; Yi Wang 090; Jun Zhang 079; Weijie Lin; Linbo Chen; Ye Han; Wenquan Che; et al. (IEEE Trans. Instrum. Meas., 2024)