A Scan Chain Based SEU Test Method for Microprocessors. - Yaqing Chi; Yibai He; Bin Liang; Chunmei Hu (NCCET, 2013)

Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology. - Yibai He; Shuming Chen (Sci. China Inf. Sci., 2014)

Flip-flops soft error rate evaluation approach considering internal single-event transient. - Ruiqiang Song; Shuming Chen; Yibai He; Yankang Du (Sci. China Inf. Sci., 2015)