Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. - Peng Luan; Yibang Wang; Wei Zhao; Chen Liu 024; Faguo Liang; Aihua Wu 007; Jing Du 004 (IEEE Trans. Instrum. Meas., 2020)

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems. - Aihua Wu 007; Xingchang Fu; Chen Liu 024; Chong Li; Yibang Wang; Faguo Liang; Peng Luan (IEEE Trans. Instrum. Meas., 2020)

A Reformulation and Sensitivity Analysis of TRL. - Wei Zhao; Yibang Wang (IEEE Trans. Instrum. Meas., 2020)