Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation. - Yibo Qiao; Weiping Xie; Shunyuan Lou; Qian Jin; Lichao Zeng; Yining Chen; Qi Sun 002; Cheng Zhuo (DAC, 2024)

DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture. - Yibo Qiao; Zhouzhouzhou Mei; Yuening Luo; Yining Chen (Comput. Ind. Eng., 2024)

A novel joint segmentation approach for wafer surface defect classification based on blended network structure. - Zhouzhouzhou Mei; Yuening Luo; Yibo Qiao; Yining Chen (J. Intell. Manuf., 2025)

SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects. - Yuening Luo; Zhouzhouzhou Mei; Yibo Qiao; Yining Chen (Appl. Intell., 2025)