A Practical Implementation of Parallel Dynamic Load Balancing for Adaptive Computing in VLSI Device Simulation. - Yiming Li 005; S. M. Sze; Tien-Sheng Chao (Eng. Comput., 2002)

Intelligent Device Parameter Extraction for Nanoscale MOSFETs Era. - Yiming Li 005; Shao-Ming Yu; Hsiao-Mei Lu (VLSI, 2003)

A novel parallel adaptive Monte Carlo method for nonlinear Poisson equation in semiconductor devices. - Yiming Li 005; Hsiao-Mei Lu; Ting-Wei Tang; S. M. Sze (Math. Comput. Simul., 2003)

A Two-Dimensional Quantum Transport Simulation of Nanoscale Double-Gate MOSFETs Using Parallel Adaptive Technique. - Yiming Li 005; Shao-Ming Yu (IEICE Trans. Inf. Syst., 2004)

Application of Parallel Adaptive Computing Technique to Polysilicon Thin-Film Transistor Simulation. - Yiming Li 005 (HPCC, 2005)

Parallelization of Multiple Genome Alignment. - Yiming Li 005; Cheng-Kai Chen (HPCC, 2005)

Adaptive Finite Volume Simulation of Electrical Characteristics of Organic Light Emitting Diodes. - Yiming Li 005; Pu Chen (International Conference on Computational Science (3), 2005)

Numerical Simulation of Self-heating InGaP/GaAs Heterojunction Bipolar Transistors. - Yiming Li 005; Kuen-Yu Huang (International Conference on Computational Science (3), 2005)

A Pattern-Based Domain Partition Approach to Parallel Optical Proximity Correction in VLSI Designs. - Shao-Ming Yu; Yiming Li 005 (IPDPS, 2005)

A numerical iterative method for solving Schrödinger and Poisson equations in nanoscale single, double and surrounding gate metal-oxide-semiconductor structures. - Yiming Li 005; Shao-Ming Yu (Comput. Phys. Commun., 2005)

Parallel Numerical Solution to Large-Scale Eigenvalue Problem in Master Equation of Protein Folding Kinetics. - Yiming Li 005; Shao-Ming Yu (AINA (2), 2006)

Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices. - Fu-Liang Yang; Jiunn-Ren Hwang; Yiming Li 005 (CICC, 2006)

A unified optimization framework for microelectronics industry. - Yiming Li 005; Cheng-Kai Chen; Yen-Yu Cho (GECCO, 2006)

Lattice Properties of Two-Dimensional Charge-Stabilized Colloidal Crystals. - Pavel Dyshlovenko; Yiming Li 005 (International Conference on Computational Science (4), 2006)

A Distributed Simulation-Based Computational Intelligence Algorithm for Nanoscale Semiconductor Device Inverse Problem. - Yiming Li 005; Cheng-Kai Chen (ISPA Workshops, 2006)

Numerical solutions of a master equation for protein folding kinetics. - Yiming Li 005 (Int. J. Bioinform. Res. Appl., 2006)

A drain-current model for DG PMOSFETs with fabricated 35 nm device comparison. - Todd McKenzie; Yiming Li 005 (Int. J. Comput. Sci. Eng., 2006)

Numerical Simulation of Static Noise Margin for a Six-Transistor Static Random Access Memory Cell with 32nm Fin-Typed Field Effect Transistors. - Yiming Li 005; Chih-Hong Hwang; Shao-Ming Yu (International Conference on Computational Science (4), 2007)

A Simulation-Based Hybrid Optimization Technique for Low Noise Amplifier Design Automation. - Yiming Li 005; Shao-Ming Yu; Yih-Lang Li (International Conference on Computational Science (4), 2007)

An Efficient Near-ML Algorithm with SQRD for Wireless MIMO Communications in Metro Transportation Systems. - Chien-Hung Pan; Ta-Sung Lee; Yiming Li 005 (ITSC, 2007)

A two-dimensional thin-film transistor simulation using adaptive computing technique. - Yiming Li 005 (Appl. Math. Comput., 2007)

A floating gate design for electrostatic discharge protection circuits. - Hung-Mu Chou; Jam-Wen Lee; Yiming Li 005 (Integr., 2007)

Analytical solution of nonlinear Poisson equation for symmetric double-gate metal-oxide-semiconductor field effect transistors. - Shih-Ching Lo; Yiming Li 005; Shao-Ming Yu (Math. Comput. Model., 2007)

Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. - Yiming Li 005; Chih-Hong Hwang; Ta-Ching Yeh; Tien-Yeh Li (ICCAD, 2008)

Parallel solution of large-scale eigenvalue problem for master equation in protein folding dynamics. - Yiming Li 005; Shao-Ming Yu; Yih-Lang Li (J. Parallel Distributed Comput., 2008)

Preface. - Yiming Li 005; Juncheng Cao; Pavel Dyshlovenko; Tatsuya Ezaki; Tor A. Fjeldly; Hans Kosina; Todd McKenzie; Hiroshi Mizuta; Laurence Tianruo Yang (Math. Comput. Simul., 2008)

Design optimization of a current mirror amplifier integrated circuit using a computational statistics technique. - Yiming Li 005; Yih-Lang Li; Shao-Ming Yu (Math. Comput. Simul., 2008)

Electronic design automation using a unified optimization framework. - Yiming Li 005; Shao-Ming Yu; Yih-Lang Li (Math. Comput. Simul., 2008)

Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit. - Yiming Li 005; Chih-Hong Hwang; Tien-Yeh Li (IEEE Trans. Circuits Syst. II Express Briefs, 2009)

Forecasting global adoption of crystal display televisions with modified product diffusion model. - Bi-Huei Tsai; Yiming Li 005; Guan-Hua Lee (Comput. Ind. Eng., 2010)

A growth model for marketing evolution of multi-generation NAND flash memory. - Su-Yun Chiang; Yiming Li 005; Hsiao-Cheng Yu (Int. J. Comput. Sci. Eng., 2010)

Temperature-aware floorplanning via geometric programming. - Ying-Chieh Chen; Yiming Li 005 (Math. Comput. Model., 2010)

Monotone iterative method for numerical solution of nonlinear ODEs in MOSFET RF circuit simulation. - Yiming Li 005 (Math. Comput. Model., 2010)

Simulation-based evolutionary method in antenna design optimization. - Yiming Li 005 (Math. Comput. Model., 2010)

Preface. - Yiming Li 005; Pavel Dyshlovenko; Tatsuya Ezaki; Tor A. Fjeldly; Hans Kosina; Todd McKenzie; Mincheol Shin; Laurence Tianruo Yang; Shao-Ming Yu (Math. Comput. Model., 2010)

The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit. - Ming-Hung Han; Yiming Li 005; Chih-Hong Hwang (Microelectron. Reliab., 2010)

Statistical variability in FinFET devices with intrinsic parameter fluctuations. - Chih-Hong Hwang; Yiming Li 005; Ming-Hung Han (Microelectron. Reliab., 2010)

Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell. - Kuo-Fu Lee; Yiming Li 005; Tien-Yeh Li; Zhong-Cheng Su; Chin-Hong Hwang (Microelectron. Reliab., 2010)

Multiband treatment of quantum transport in anisotropic semiconductors: Non-equilibrium Green's function. - Chun-Nan Chen; Sheng-Hsiung Chang; Wei-Long Su; Jen-Yi Jen; Yiming Li 005 (Math. Comput. Model., 2013)

Computer simulation of electron energy state spin-splitting in nanoscale InAs/GaAs semiconductor quantum rings. - Yiming Li 005 (Math. Comput. Model., 2013)

Geometric programming approach to doping profile design optimization of metal-oxide-semiconductor devices. - Yiming Li 005; Ying-Chieh Chen (Math. Comput. Model., 2013)

Preface. - Yiming Li 005; Chun-Nan Chen; Yoshinari Kamakura; Todd McKenzie; Mincheol Shin; Laurence T. Yang; Shao-Ming Yu (Math. Comput. Model., 2013)

Electrical characteristic and power consumption fluctuations of trapezoidal bulk FinFET devices and circuits induced by random line edge roughness. - Chieh-Yang Chen; Wen-Tsung Huang; Yiming Li 005 (ISQED, 2015)

Influence of Fringing-Field on DC/AC Characteristics of Si₁₋ₓGeₓ Based Multi-Channel Tunnel FETs. - Narasimhulu Thoti; Yiming Li 005 (IEEE Access, 2020)

Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (IEEE Access, 2021)

A Nanosized-Metal-Grain Pattern-Dependent Threshold Voltage Model for the Work Function Fluctuation of GAA Si NW MOSFETs. - Wen-Li Sung; Yiming Li 005 (IEEE Access, 2021)

Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola (ISQED, 2022)

A Unified Statistical Analysis of Comprehensive Fluctuations of Gate-All-Around Silicon Nanosheet MOSFETs Induced by RDF, ITF, and WKF Simultaneously. - Sekhar Reddy Kola; Yiming Li 005; Chieh-Yang Chen; Min-Hui Chuang (ISQED, 2022)

Model Auto Extraction for Gate-All-Around Silicon Nanowire MOSFETs Using A Decomposition-Based Many-Objective Evolutionary Algorithm. - Ya-Shu Yang; Yiming Li 005 (ISQED, 2022)

Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors. - Chandni Akbar; Yiming Li 005; Narasimhulu Thoti (IEEE Access, 2022)

A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola (IEEE Access, 2022)

Transfer learning approach to analyzing the work function fluctuation of gate-all-around silicon nanofin field-effect transistors. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (Comput. Electr. Eng., 2022)

Intrinsic Parameter Fluctuation and Process Variation Effect of Vertically Stacked Silicon Nanosheet Complementary Field-Effect Transistors. - Sekhar Reddy Kola; Yiming Li 005; Min-Hui Chuang (ISQED, 2023)

A Hybrid 1D-CNN-LSTM Technique for WKF-Induced Variability of Multi-Channel GAA NS- and NF-FETs. - Sagarika Dash; Yiming Li 005; Wen-Li Sung (IEEE Access, 2023)

Exploring the Performance of 3-D Nanosheet FET in Inversion and Junctionless Modes: Device and Circuit-Level Analysis and Comparison. - V. Bharath Sreenivasulu; Aruna Kumari Neelam; Sekhar Reddy Kola; Jawar Singh; Yiming Li 005 (IEEE Access, 2023)

Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola; Chandni Akbar; Min-Hui Chuang (Comput. Electr. Eng., 2023)

Transfer learning approach to modeling multichannel gate-all-around nanosheet field-effect transistors under work function fluctuations. - Sagarika Dash; Yiming Li 005 (Eng. Appl. Artif. Intell., 2025)