Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. - Yiming Qu; Ran Cheng; Wei Liu; Junkang Li; Bich-Yen Nguyen; Olivier Faynot; Nuo Xu; Bing Chen; Yi Zhao 015 (IRPS, 2018)

Sub-1 ns characterization methodology for transistor electrical parameter extraction. - Yiming Qu; Bing Chen; Wei Liu; Jinghui Han; Jiwu Lu; Yi Zhao 015 (Microelectron. Reliab., 2018)

Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System. - Shifan Gao; Bing Chen; Nuo Xu; Yiming Qu; Yi Zhao 015 (IRPS, 2019)

In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. - Yiming Qu; Jiwu Lu; Junkang Li; Zhuo Chen; Jie Zhang; Chunlong Li; Shiuh-Wuu Lee; Yi Zhao 015 (IRPS, 2020)

Nano-scaled transistor reliability characterization at nano-second regime. - Ran Cheng; Ying Sun; Yiming Qu; Wei Liu; Fanyu Liu; Jianfeng Gao 005; Nuo Xu; Bing Chen (Sci. China Inf. Sci., 2021)

Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. - Yaru Ding; Wei Liu; Yiming Qu; Liang Zhao; Yi Zhao 015 (IRPS, 2022)

GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. - Yiming Qu; Yang Shen; Mingji Su; Jiwu Lu; Yi Zhao 015 (IRPS, 2022)

Universal Hot Carrier Degradation Model under DC and AC Stresses. - Chu Yan; Yaru Ding; Yiming Qu; Liang Zhao; Yi Zhao 015 (IRPS, 2022)

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. - Yaru Ding; Xinwei Yu; Chu Yan; Zeping Weng; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. - Yiming Qu; Chu Yan; Xinwei Yu; Yaru Ding; Yi Zhao 015 (IRPS, 2023)

GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. - Xinwei Yu; Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

Multimedia teaching resource allocation method for distance online education based on packet cluster mapping. - Yiming Qu; I-Hua Chen; Shangjie Meng (Int. J. Inf. Commun. Technol., 2023)

Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. - Yiming Qu; Chu Yan; Yaru Ding; Yi Zhao 015 (IRPS, 2024)

Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications. - Zeping Weng; Zhangsheng Lan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2024)

Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. - Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2024)

Observation of Self-heating Process in STT-MRAM and Its Implication in Device Operations. - Zhangsheng Lan; Yiming Qu; Shifan Gao; Yi Wei; Yuhao Chen; Wenchao Yan; Ming Wang; Xiaolei Yang; Shikun He; Yi Zhao (IRPS, 2025)