Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs. - Amratansh Gupta; Hao Yu; Sachin Yadav 001; AliReza Alian; Uthavasankaran Peralagu; E.-San Jang; Ying-Chun Kuo; Nadine Collaert; Bertrand Parvais (IRPS, 2025)

Toward Understanding Stability of RF MIS-HEMTs Under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses. - Yi Yang; Hao Yu; Meng-Che Tsai; Wei-Tung Lin; Ying-Chun Kuo; Barry J. O'Sullivan; Aarti Rathi; Amratansh Gupta; Sachin Yadav 001; AliReza Alian; Uthayasankaran Peralagu; Bertrand Parvais; et al. (IRPS, 2025)

Perspectives on GaN MISHEMT Power Amplifier Versus Positive Gate Bias Instability. - Hao Yu; R. ElKashlan; Meng-Che Tsai; Yi Yang; Mamoun Guenach; Ying-Chun Kuo; Sachin Yadav 001; Barry J. O'Sullivan; Aarti Rathi; Amratansh Gupta; D. Xiao; Claude Desset; et al. (IRPS, 2025)