Testing functional faults in VLSI. - Yinghua Min; Stephen Y. H. Su (DAC, 1982)

Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits. - Yinghua Min; Zhongcheng Li (Comput. Syst. Sci. Eng., 1986)

Strongly fault secure PLAs and totally self-checking checkers. - Yinghua Min; Jintao Li (IEEE Trans. Computers, 1988)

Analysis of Detection Capability of Parallel Signature Analyzers. - Yinghua Min; Yashwant K. Malaiya; Boping Jin (IEEE Trans. Computers, 1991)

Evaluation of test generation algorithms. - Yinghua Min; Zhongcheng Li (VTS, 1993)

Behavioral Design and Prototyping of a Fail-Safe System. - Yinghua Min; Yutang Zhou; Zhongcheng Li; Cheng Ye 003; Yuqi Pan (VLSI Design, 1994)

Panel: New Research Problems in the Emerging Test Technology. - Vishwani D. Agrawal; Bernard Courtois; Fumiyasu Hirose; Sandip Kundu; Chung-Len Lee; Yinghua Min; Parimal Pal Chaudhuri (Asian Test Symposium, 1995)

Boolean process-an analytical approach to circuit representation (II). - Yinghua Min; Zhuxing Zhao; Zhongcheng Li (Asian Test Symposium, 1995)

Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (FTCS, 1995)

A fault-tolerant and heuristic routing algorithm for faulty hypercubes. - Youli Min; Yinghua Min (J. Comput. Sci. Technol., 1995)

Waveform Polynomial Manipulation Using Bdds. - Zhuxing Zhao; Zhongcheng Li; Yinghua Min (Asian Test Symposium, 1996)

An Analytical Delay Model Based on Boolean Process. - Yinghua Min; Zhuxing Zhao; Zhongcheng Li (VLSI Design, 1996)

Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (J. Electron. Test., 1996)

A kind of Multistage Interconnection Networks with multiple paths. - Yingquan Zhou; Yinghua Min (J. Comput. Sci. Technol., 1996)

Memory Efficient ATPG for Path Delay Faults. - Wangning Long; Shiyuan Yang; Zhongcheng Li; Yinghua Min (Asian Test Symposium, 1997)

IDDT Testing. - Yinghua Min; Zhuxing Zhao; Zhongcheng Li (Asian Test Symposium, 1997)

Design of delay-verifiable combinational logic by adding extra inputs. - Xiaoming Yu; Yinghua Min (Asian Test Symposium, 1997)

Timed Binary Decision Diagrams. - Zhongcheng Li; Yuhong Zhao; Yinghua Min; Robert K. Brayton (ICCD, 1997)

Efficient Identification of Non-Robustly Untestable Path Delay Faults. - Zhongcheng Li; Robert K. Brayton; Yinghua Min (ITC, 1997)

Short-time scaling of variable ordering of OBDDs. - Wangning Long; Yinghua Min; Shiyuan Yang; Shibai Tong (J. Comput. Sci. Technol., 1997)

Path sensitization. - Zhuxing Zhao; Yinghua Min; Zhongcheng Li (J. Comput. Sci. Technol., 1997)

Delay Testing with Double Observations. - Huawei Li 001; Zhongcheng Li; Yinghua Min (Asian Test Symposium, 1998)

A New Low-Cost Method for Identifying Untestable Path Delay Faults. - Zhongcheng Li; Yinghua Min; Robert K. Brayton (Asian Test Symposium, 1998)

IDDT Testing versus IDDQ Testing. - Yinghua Min; Zhongcheng Li (J. Electron. Test., 1998)

On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (Int. J. Circuit Theory Appl., 1998)

A Novel NMR Structure with Concurrent Error Location Capabilities. - Jianhui Jiang; Hongbao Shi; Yinghua Min; Xiaodong Zhao (PRDC, 1999)

An analytical delay model. - Yinghua Min; Zhongcheng Li (J. Comput. Sci. Technol., 1999)

An efficient BIST design using LFSR-ROM architecture. - Lijian Li 001; Yinghua Min (Asian Test Symposium, 2000)

A waveform simulator based on Boolean process. - Lijian Li 001; Xiaoyang Yu; Cheng-Wen Wu; Yinghua Min (Asian Test Symposium, 2000)

Optimal Fault-Tolerant Routing in Hypercubes Using Extended Safety Vectors. - Jie Wu 001; Feng Gao; Zhongcheng Li; Yinghua Min (ICPADS, 2000)

Reduction of Number of Paths to be Tested in Delay Testing. - Huawei Li 001; Zhongcheng Li; Yinghua Min (J. Electron. Test., 2000)

An RT-Level ATPG Based on Clustering of Circuit States. - Huawei Li 001; Yinghua Min; Zhongcheng Li (Asian Test Symposium, 2001)

An Approach to RTL Fault Extraction and Test Generation. - Zhigang Yin; Yinghua Min; Xiaowei Li 001 (Asian Test Symposium, 2001)

Reducing Power Dissipation during At-Speed Test Application. - Xiaowei Li 001; Huawei Li 001; Yinghua Min (DFT, 2001)

Node Grouping in System-Level Fault Diagnosis. - Dafang Zhang 001; Gaogang Xie; Yinghua Min (J. Comput. Sci. Technol., 2001)

Test Power Optimization Techniques for CMOS Circuits. - Zuying Luo; Xiaowei Li 001; Huawei Li 001; Shiyuan Yang; Yinghua Min (Asian Test Symposium, 2002)

Clustering of behavioral phases in FSMs and its applications to VLSI test. - Huawei Li 001; Yinghua Min; Zhongcheng Li (Sci. China Ser. F Inf. Sci., 2002)

The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications. - Zuying Luo; Yinghua Min; Shiyuan Yang; Xiaowei Li 001 (Sci. China Ser. F Inf. Sci., 2002)

Why RTL ATPG? - Yinghua Min (J. Comput. Sci. Technol., 2002)

At-Speed Current Testing. - Yinghua Min; Jishun Kuang; Xiaoyan Niu (Asian Test Symposium, 2003)

Domain Testing Based on Character String Predicate. - Ruilian Zhao; Michael R. Lyu; Yinghua Min (Asian Test Symposium, 2003)

A New Software Testing Approach Based on Domain Analysis of Specifications and Programs. - Ruilian Zhao; Michael R. Lyu; Yinghua Min (ISSRE, 2003)

Fault-Tolerant Systems with Concurrent Error-Locating Capability. - Jianhui Jiang; Yinghua Min; Chenglian Peng (J. Comput. Sci. Technol., 2003)

IDDT: Fundamentals and Test Generation. - Jishun Kuang; Zhiqiang Yang; Qijian Zhu; Yinghua Min (J. Comput. Sci. Technol., 2003)

A Novel RT-Level Behavioral Description Based ATPG Method. - Zhigang Yin; Yinghua Min; Xiaowei Li 001; Huawei Li 001 (J. Comput. Sci. Technol., 2003)

Design & Test Education in Asia. - Debesh K. Das; Hideo Fujiwara; Yungang Li; Yinghua Min; Shiyi Xu; Yervant Zorian (IEEE Des. Test Comput., 2004)

An Improved Scheme of Index-Based Checkpointing. - Yuan-sheng Luo; Dafang Zhang; Yinghua Min (PRDC, 2005)

Optimal, and reliable communication in hypercubes using extended safety vectors. - Jie Wu 001; Feng Gao; Zhongcheng Li; Yinghua Min (IEEE Trans. Reliab., 2005)

Test Education in the Global Economy. - Jacob Abraham; Salvador Mir; Yinghua Min; Jeremy Wang; Cheng-Wen Wu (ATS, 2007)

A Scalable Bloom Filter for Membership Queries. - Kun Xie 001; Yinghua Min; Dafang Zhang 001; Jigang Wen; Gaogang Xie (GLOBECOM, 2007)

Survey on Traffic of Metro Area Network with Measurement On-Line. - Gaogang Xie; Guangxing Zhang; Jianhua Yang; Yinghua Min; Valérie Issarny; Alberto Conte (ITC, 2007)

Accurate Online Traffic Classification with Multi-Phases Identification Methodology. - Guangxing Zhang; Gaogang Xie; Jianhua Yang; Yinghua Min; Zhaomin Zhou; Xiaodong Duan (CCNC, 2008)

Impact of Hazards on Pattern Selection for Small Delay Defects. - Jie Wang; Huawei Li 001; Yinghua Min; Xiaowei Li 001; Huaguo Liang (PRDC, 2009)

Automatic string test data generation for detecting domain errors. - Ruilian Zhao; Michael R. Lyu; Yinghua Min (Softw. Test. Verification Reliab., 2010)

Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects. - Ying Zhang 040; Huawei Li 001; Yinghua Min; Xiaowei Li 001 (IEEE Trans. Very Large Scale Integr. Syst., 2011)