Development and Characterization of High Temperature Plasma Nitridation Process for Advanced CMOS Technology Application. - Xiaoxu Kang; Xiaolan Zhong; Zhangfa Chen; Zhengkai Dao; Qiang Zhang; Hao Wan; Yamin Zhou; Ming Li; Yingjia Guo; Ran Nie; Tao Wu (ASICON, 2021)

Generic Cryo-CMOS Device Modeling and EDACompatible Platform for Reliable Cryogenic IC Design. - Zewei Wang; Zhidong Tang; Yumeng Yuan; Ao Guo; Xin Luo; Renhe Chen; Chengwei Cao; Linlin Liu; Zhenghang Zhi; Weican Wu; Yingjia Guo; Yongqi Hu; et al. (CoRR, 2022)

Structural damage identification method of concrete dam based on multi-fidelity surrogate model collaboratively corrected by monitoring and simulation information. - Yingjia Guo; Dongyang Yuan; Bowen Wei; Yating Hu (Adv. Eng. Informatics, 2025)