Electron Radiation Effects on the 4H-SiC PiN Diodes Characteristics: An Insight From Point Defects to Electrical Degradation. - Peng Dong 003; Yazhou Qin; Xuegong Yu; Xingliang Xu; Zhe Chen; Liang-Hui Li; Yingxin Cui (IEEE Access, 2019)

Construction and Structural Analysis of Inter-Regional Industrial Circular Network: A Case of the Middle and Lower Reaches of the Yellow River in China. - Chong Yin; Yingxin Cui; Yue Liu; Xiaoni Su (Complex., 2022)

Simulation and fabrication of 4H-SiC SBD with main P-epilayer island termination. - Xinyu Wang; Dengwen Yuan; Shicheng Zhu; Xiyao Huang; Yaxin Li; Lei Ge; Yingxin Cui; Mingsheng Xu; Yu Zhong; Xiaobo Hu; Kuan Yew Cheong; Xiangang Xu; et al. (Microelectron. J., 2025)

Temperature dependence of dynamic performance of SiC MOSFETs in a half-bridge configuration. - Tianlu Wang; Yu Zhong; Lan Luo; Fanpeng Zeng; Ziang Zhao; Yingxin Cui; Mingsheng Xu; Xiangang Xu; Handoko Linewih; Jisheng Han (Microelectron. J., 2025)