Movable Noncontact RF Current Measurement on a PCB Trace. - Haimi Qiu; Wenxiao Fang; Yunfei En; Yun Huang; Yuan Liu; Ping Lai; Yiqiang Chen 002; Chunlei Shi (IEEE Trans. Instrum. Meas., 2017)

Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation. - Zhifeng Lei; H. X. Guo; M. H. Tang; C. Zeng; Zhangang Zhang; H. Chen; Yunfei En; Y. Huang; Yiqiang Chen 002; Chao Peng (Microelectron. Reliab., 2018)

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. - Rui Gao 003; Mehzabeen Mehedi; Haibao Chen; Xinsheng Wang; Jianfu Zhang 001; Xiaoling Lin; Zhiyuan He; Yiqiang Chen 002; Dengyun Lei; Yun Huang; Yunfei En; Zhigang Ji; et al. (IRPS, 2020)

Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. - Chao Peng; Zhifeng Lei; Rui Gao 003; Zhangang Zhang; Yiqiang Chen 002; Yunfei En; Yun Huang (IEEE Access, 2020)

Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs. - Chao Peng; Rui Gao 003; Zhifeng Lei; Zhangang Zhang; Yiqiang Chen 002; Yunfei En; Yun Huang (IEEE Access, 2021)

Noninvasive Flexible Current Probe as a Diagnosis Tool Inside a PWM Chopper Module. - Chengyang Luo 001; Rui Ding 011; Wenxiao Fang; Lei Wang 092; Yiqiang Chen 002; Raúl Fernández-García (IEEE Trans. Instrum. Meas., 2024)

Non-Contact Time-Varying Current Reconstruction for Electromagnetic Immunity Diagnosis in Electric Vehicle Module Injection Port Testing. - Chengyang Luo 001; Rui Ding 011; Wenxiao Fang; Wei-Heng Shao; Jianke Li; Lei Wang 092; Yiqiang Chen 002; Raúl Fernández-García (IEEE Trans. Ind. Electron., 2025)