Accurate off-current evaluation by parasitic capacitance extraction in capacitor-less DRAM cells. - Daisuke Matsubayashi; Subhali Subhechha; Hyungrock Oh; Nouredine Rassoul; Shamin Houshmand Sharifi; Yiqun Wan; Shreya Kundu; Harinarayanan Puliyalil; Harold Dekkers; Alexandru Pavel; Inhee Lee 004; Gouri Sankar Kar; et al. (IMW, 2025)

Dynamic Flash Memory Operation Experimentally Validated with 65nm SOI Technology. - Koji Sakui; Daniele Garbin; Yoshihisa Iwata; Gautam Gaddemane; Yisuo Li; Yiqun Wan; Ken'ichi Kanazawa; Eyup Can Demir; Iwao Kunishima; Andrea Fantini; Masakazu Kakumu; Christophe Lorant; et al. (IMW, 2025)

Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT. - Simon Van Beek; Adrian Vaisman Chasin; Subhali Subhechha; Harold Dekkers; Nouredine Rassoul; Yiqun Wan; Hongwei Tang; Joao P. Bastos; Attilio Belmonte; Gouri Sankar Kar (IRPS, 2025)