Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. - Yibo Lei; Jian Fang; Yingdong Liang; Yisen Zhang; Ling Yan; Lingli Tang; Xihe Yang; Bo Zhang 027 (Microelectron. J., 2023)

A 3.0-V 4.2-μA 2.23-ppm/°C BGR with cross-connected NPNs and base-current compensation. - Weidong Xue; Xinwei Yu; Yisen Zhang; Xin Ming; Jian Fang; Junyan Ren (Microelectron. J., 2024)

A 24V-to-1V Triple Series-Capacitor Buck Converter With Low-Voltage Power Switches. - Weidong Xue; Xinwei Yu; Yisen Zhang; Junyan Ren (IEEE Trans. Circuits Syst. II Express Briefs, 2025)