Automating ML Model Development at Scale. - Kaiyuan Wang; Yang Li 005; Junyang Shen; Kaikai Sheng; Yiwei You; Jiaqi Zhang; Srikar Ayyalasomayajula; Julian Grady; Martin Wicke (SEIP@ICSE, 2025)

RaCo: Reliable multi-augmentation complementary label learning. - Yiwei You; Zan Chen; Meng Xu; Bo Wang 049 (Inf. Sci., 2025)

Tackling biased complementary label learning with large margin. - Yiwei You; Jinglong Huang; Qiang Tong 004; Bo Wang 049 (Inf. Sci., 2025)