IP library-based general and visualized MEMS device simulation and verification tool. - Xin Zhao; Yiyong Tan; Guizhang Lu; Xin Li (NEMS, 2010)

Few-Shot and Portable 3D Manufacturing Defect Tracking with Enterprise Digital Twins Based Mixed Reality. - Yiyong Tan; Bhaskar Banerjee; Rishi Ranjan (ICPR (33), 2024)