ISTA: Automatic Test Case Generation and Optimization for Intelligent Systems based on Coverage Analysis. - Wei Zheng 006; Lidan Lin; Xiang Chen 005; Guoliang Liu; Hao Huang; Jinjin Shen; Qingqing Xu; Yizeng Gu (SANER, 2023)

ISTA+: Test case generation and optimization for intelligent systems based on coverage analysis. - Xiaoxue Wu 001; Yizeng Gu; Lidan Lin; Wei Zheng 006; Xiang Chen 005 (Sci. Comput. Program., 2024)