Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs. - Liquan Fang; Mohammed Lemnawar; Yizi Xing (ITC, 2006)

Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC. - Liquan Fang; Yang Zhong; H. van de Donk; Yizi Xing (ATS, 2007)

Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs. - Yizi Xing; Liquan Fang (Asian Test Symposium, 2010)

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. - Hamidreza Hashempour; Jos Dohmen; Bratislav Tasic; Bram Kruseman; Camelia Hora; Maikel van Beurden; Yizi Xing (DATE, 2011)

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. - Nivesh Rai; Hamidreza Hashempour; Yizi Xing; Bram Kruseman; Said Hamdioui (DFT, 2011)

Defect Oriented Testing for analog/mixed-signal devices. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (ITC, 2011)

Defect Oriented Testing for Analog/Mixed-Signal Designs. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (IEEE Des. Test Comput., 2012)

Diagnosis of Local Spot Defects in Analog Circuits. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir; Camelia Hora; Yizi Xing; Bram Kruseman (IEEE Trans. Instrum. Meas., 2012)