Testing Safety Critical Ada Code Using Non Real Time Testing. - Yogananda V. Jeppu; Kundapur Karunakar; P. S. Subramanyam (Ada-Europe, 2003)

A Randomised Test Approach to Testing Safety Critical Ada Code. - Sukant K. Giri; Atit Mishra; Yogananda V. Jeppu; Kundapur Karunakar (Ada-Europe, 2004)

Artificial Intelligence learning based on proportional navigation guidance. - Chethan Chithapuram; Yogananda V. Jeppu; Cherukuri Aswani Kumar (ICACCI, 2013)

An auto-review tool for model-based testing of safety-critical systems. - Atit Mishra; Manjunatha Rao; Chethan CU; Vanishree Rao; Yogananda V. Jeppu; Nagaraj Murthy (JAMAICA@ISSTA, 2013)

Flight Control Software: Mistakes Made and Lessons Learned. - Yogananda V. Jeppu (IEEE Softw., 2013)

Generating Test Cases with 100-Percent Requirements Coverage Using Design of Experiments. - Yogananda V. Jeppu; Gonzalo J. Rey; Prakash R. Apte (J. Aerosp. Inf. Syst., 2014)

Aerial vehicle guidance based on passive machine learning technique. - Chethan Chithapuram; Aswani Kumar Cherukuri; Yogananda V. Jeppu (Int. J. Intell. Comput. Cybern., 2016)

Few-Shot Open-Set Recognition of Hyperspectral Images with Outlier Calibration Network. - Debabrata Pal; Valay Bundele; Renuka Sharma; Biplab Banerjee; Yogananda V. Jeppu (WACV, 2022)

SPN: Stable Prototypical Network for Few-Shot Learning-Based Hyperspectral Image Classification. - Debabrata Pal; Valay Bundele; Biplab Banerjee; Yogananda V. Jeppu (IEEE Geosci. Remote. Sens. Lett., 2022)

MORGAN: Meta-Learning-based Few-Shot Open-Set Recognition via Generative Adversarial Network. - Debabrata Pal; Shirsha Bose; Biplab Banerjee; Yogananda V. Jeppu (WACV, 2023)

Extreme Value Meta-Learning for Few-Shot Open-Set Recognition of Hyperspectral Images. - Debabrata Pal; Shirsha Bose; Biplab Banerjee; Yogananda V. Jeppu (IEEE Trans. Geosci. Remote. Sens., 2023)

MAML-SR: Self-adaptive super-resolution networks via multi-scale optimized attention-aware meta-learning. - Debabrata Pal; Shirsha Bose; Deeptej More; Ankit Jha; Biplab Banerjee; Yogananda V. Jeppu (Pattern Recognit. Lett., 2023)