Analysis of current distribution on IGBT under unclamped inductive switching conditions. - Yohei Iwahashi; Yoshihito Mizuno; Masafumi Hara; Ryuzo Tagami; Masanori Ishigaki (Microelectron. Reliab., 2012)

3D electro-thermal simulations of wide area power devices operating in avalanche condition. - Michele Riccio; Giuseppe De Falco; Luca Maresca; Giovanni Breglio; Ettore Napoli; Andrea Irace; Yohei Iwahashi; Paolo Spirito (Microelectron. Reliab., 2012)

Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. - Vincenzo d'Alessandro; Alessandro Magnani; Michele Riccio; Yohei Iwahashi; Giovanni Breglio; Niccolò Rinaldi; Andrea Irace (Microelectron. Reliab., 2013)

Impact of gate drive voltage on avalanche robustness of trench IGBTs. - Michele Riccio; Luca Maresca; Andrea Irace; Giovanni Breglio; Yohei Iwahashi (Microelectron. Reliab., 2014)