Re-consideration of Correlation between Interface and Bulk Trap Generations using Cryogenic Measurement. - Yuichiro Mitani; Tatsuya Suzuki; Yohei Miyaki (IRPS, 2024)

Re-Consideration of Correlation Between Interface States and Bulk Traps Using Cryogenic Measurement. - Yuichiro Mitani; Tatsuya Suzuki; Yohei Miyaki (ASP-DAC, 2025)