Access network architectural issues for future telecommunication networks. - Koichi Asatani; Yoichi Maeda (IEEE Commun. Mag., 1998)

A standardization plan for broadband access network transport. - Yoichi Maeda; Reinhold Feigel (IEEE Commun. Mag., 2001)

FSAN OAN-WG and future issues for broadband optical access networks. - Yoichi Maeda; Kenji Okada; David Faulkner (IEEE Commun. Mag., 2001)

Viewing Cube and Its Visual Angles. - Yoichi Maeda (JCDCG, 2002)

Observing an Angle from Various Viewpoints. - Yoichi Maeda; Hiroshi Maehara (JCDCG, 2002)

QoS standards for ip-based networks. - Yoichi Maeda (IEEE Commun. Mag., 2003)

Visual Pascal Configuration and Quartic Surface. - Yoichi Maeda (JCDCG, 2004)

Guest editorial: Standards for virtual private networks. - Yoichi Maeda (IEEE Commun. Mag., 2004)

Standards for the next-generation network. - Yoichi Maeda; Brian Moore (IEEE Commun. Mag., 2005)

Standardization trends of next generation optical access systems. - Yoichi Maeda (IEEE Commun. Mag., 2006)

Adaptive Clock Recovery Method Utilizing Proportional-Integral-Derivative (PID) Control for Circuit Emulation. - Youichi Fukada; Takeshi Yasuda; Shuji Komatsu; Koichi Saito; Yoichi Maeda; Yasuyuki Okumura (IEICE Trans. Commun., 2006)

Special Section on the Next Generation Ethernet Technologies. - Yoichi Maeda (IEICE Trans. Commun., 2006)

Seven Types of Random Spherical Triangle in S n and Their Probabilities. - Yoichi Maeda (KyotoCGGT, 2007)

Standardization Trends for Carrier-Class Ethernet in ITU-T and IEEE 802 [Guest Editorial]. - Yoichi Maeda; Geoff Thompson; Bilel Jamoussi (IEEE Commun. Mag., 2007)

CooLBIST: An Effective Approach of Test Power Reduction for LBIST. - Jun Matsushima; Yoichi Maeda; Masahiro Takakura (ATS, 2008)

ITU-T international standards in information and communications technologies. - Yoichi Maeda; Koichi Asatani (IEEE Commun. Mag., 2008)

Standardization Activities on Broadband Access Systems. - Kenji Nakanishi; Akihiro Otaka; Yoichi Maeda (IEICE Trans. Commun., 2008)

Standardization trends and prospective views on the next generation of broadband optical access systems. - Frank J. Effenberger; Junichi Kani; Yoichi Maeda (IEEE J. Sel. Areas Commun., 2010)

An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. - Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima; Masahiro Takakura (Asian Test Symposium, 2012)

The 4th ITU kaleidoscope conference "The fully networked human? innovations for future networks and services". - Mostafa Hashem Sherif; Kai Jakobs; Martin Adolph; Yoichi Maeda (IEEE Commun. Mag., 2012)

Standards dynamics for digital broadcasting, internet address authentication, and low-rate personal area networks [Series Editorial]. - Mostafa Hashem Sherif; Yoichi Maeda (IEEE Commun. Mag., 2013)

Standards for efficient delivery of future services [Series Editorial]. - Mostafa Hashem Sherif; Yoichi Maeda (IEEE Commun. Mag., 2013)

Selected papers from the Fifth ITU Kaleidoscope Academic Conference [Series Editorial]. - Mostafa Hashem Sherif; Yoichi Maeda; Kai Jakobs; Martin Adolph (IEEE Commun. Mag., 2014)

Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. - Yoichi Maeda; Jun Matsushima; Ron Press (ATS, 2017)

Active Learning with Dynamic Geometry Software. - Yoichi Maeda (ICCSA (4), 2017)

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. - Senling Wang; Tomoki Aono; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (ATS, 2018)

Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. - Senling Wang; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (ETS, 2018)

Innovative practices on test in Japan. - Koji Asami; Yoshiro Tamura; Haruo Kobayashi 001; Jun Matsushima; Yoichi Maeda; Kazumi Hatayama (VTS, 2018)

Standardization and Technology Trends in Optical, Wireless and Virtualized Access Systems. - Tomoya Hatano; Junichi Kani; Yoichi Maeda (IEICE Trans. Commun., 2019)

FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST. - Hanan T. Al-Awadhi; Tomoki Aono; Senling Wang; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (IEICE Trans. Inf. Syst., 2020)

A Power Reduction Method for Scan Testing in Ultra-Low Power Designs. - Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (ATS, 2021)

A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy. - Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima; Oussama Laouamri; Naveen Khanna; Jeff Mayer; Nilanjan Mukherjee (ITC, 2023)

Test Point Insertion for Multi-Cycle Power-On Self-Test. - Senling Wang; Xihong Zhou; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (ACM Trans. Design Autom. Electr. Syst., 2023)