Degradation mechanisms of GaAs PHEMTs in high humidity conditions. - Takayuki Hisaka; Yasuki Aihara; Yoichi Nogami; Hajime Sasaki; Yasushi Uehara; Naohito Yoshida; Kazuo Hayashi (Microelectron. Reliab., 2005)

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. - Takayuki Hisaka; Hajime Sasaki; Yoichi Nogami; Kenji Hosogi; Naohito Yoshida; Anita A. Villanueva; Jesús A. del Alamo; Shigehiko Hasegawa; Hajime Asahi (Microelectron. Reliab., 2009)