A full chip integrated power and substrate noise analysis framework for mixed-signal SoC design. - Daisuke Kosaka; Yoji Bando; Goichi Yokomizo; Kunihiko Tsuboi; Ying Shiun Li; Shen Lin; Makoto Nagata (CICC, 2009)

Accurate analysis of substrate sensitivity of active transistors in an analog circuit. - Satoshi Takaya; Yoji Bando; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (ISQED, 2011)

Microprocessor power noise measurements with different levels of resource occupancy. - Yoji Bando; Makoto Nagata (IEICE Electron. Express, 2011)

A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits. - Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2011)

On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement. - Masaaki Souda; Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2011)

On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors. - Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2012)

A 71dB-SNDR 50MS/s 4.2mW CMOS SAR ADC by SNR enhancement techniques utilizing noise. - Takashi Morie; Takuji Miki; Kazuo Matsukawa; Yoji Bando; Takeshi Okumoto; Koji Obata; Shiro Sakiyama; Shiro Dosho (ISSCC, 2013)

Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation. - Satoshi Takaya; Yoji Bando; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2013)

A 4.2 mW 50 MS/s 13 bit CMOS SAR ADC With SNR and SFDR Enhancement Techniques. - Takuji Miki; Takashi Morie; Kazuo Matsukawa; Yoji Bando; Takeshi Okumoto; Koji Obata; Shiro Sakiyama; Shiro Dosho (IEEE J. Solid State Circuits, 2015)